Nanomaterials Reflectometer




FILMMETRICS F20UV, Bridge Tronic Global

  • integrated spectrometer,
  • flattening filter for highly reflective substrates,
  • standalone software for remote data analysis,
  • reflectance reference samples,
  • thickness reference samples,
  • sample table with fiber optic cable and HT1 lamp
  • thickness measurement range: 1 nm – 40 μm for wavelength range 190 – 1100 nm
  • measurement of layer thickness,
  • measurement of the refractive index

01Ask a question