Nanomaterials Reflectometer

FILMMETRICS F20UV, Bridge Tronic Global

• integrated spectrometer,
• flattening filter for highly reflective substrates,
• standalone software for remote data analysis,
• reflectance reference samples,
• thickness reference samples,
• sample table with fiber optic cable and HT1 lamp
• thickness measurement range: 1 nm – 40 μm for wavelength range 190 – 1100 nm
• measurement of layer thickness,
• measurement of the refractive index