Nanomaterials Reflectometer
Nanomaterials
![](https://cbrtp.pl/wp-content/uploads/2022/04/DSC04117-scaled.jpg)
01Reflectometer
Parameters
FILMMETRICS F20UV, Bridge Tronic Global
- integrated spectrometer,
- flattening filter for highly reflective substrates,
- standalone software for remote data analysis,
- reflectance reference samples,
- thickness reference samples,
- sample table with fiber optic cable and HT1 lamp
- thickness measurement range: 1 nm – 40 μm for wavelength range 190 – 1100 nm
- measurement of layer thickness,
- measurement of the refractive index
![](https://cbrtp.pl/wp-content/uploads/2022/04/DSC041121.jpg)